X-ray CT: a powerful analysis tool for assessing the internal structure of valuable objects and for constructing a 3D database

Jan Dewanckele, Veerle Cnudde, Jelle Vlassenbroeck, Manuel Dierick, Yoni De Witte, Denis Van Loo, Matthieu Boone, Koen Pieters, Bert Masschaele, Luc Van Hoorebeke, Patric Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the 14th International Conference on Virtual Systems and Multimedia, Project Papers
EditorsM Ioannides, A Addison, A Georgopoulos, L Kalisperis
Pages357-363
Number of pages7
Publication statusPublished - 2008

Cite this