X-ray computed microtomography on cementitious materials: Possibilities and limitations

Veerle Boel, Veerle Cnudde, Geert De Schutter, Bart Van Meel, Bert Masschaele, Guang Ye, Luc Van Hoorebeke, Patric Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Material Science

Chemical Engineering