Abstract
The previously described method for absolute structure determination [Hooft,
Straver & Spek (2008). J. Appl. Cryst. 41, 96–103] assumes a Gaussian error
distribution. The method is now extended to make it robust against poor data
with large systematic errors with the introduction of the Student t-distribution. It
is shown that this modification makes very little difference for good data but
dramatically improves results for data with a non-Gaussian error distribution.
| Original language | English |
|---|---|
| Pages (from-to) | 665-668 |
| Number of pages | 4 |
| Journal | Journal of Applied Crystallography |
| Volume | 43 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2010 |