Abstract
The previously described method for absolute structure determination [Hooft,
Straver & Spek (2008). J. Appl. Cryst. 41, 96–103] assumes a Gaussian error
distribution. The method is now extended to make it robust against poor data
with large systematic errors with the introduction of the Student t-distribution. It
is shown that this modification makes very little difference for good data but
dramatically improves results for data with a non-Gaussian error distribution.
Original language | English |
---|---|
Pages (from-to) | 665-668 |
Number of pages | 4 |
Journal | Journal of Applied Crystallography |
Volume | 43 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2010 |