Unambiguous determination of Fourier-transform infrared spectroscopy proportionality factors: The case of silicon nitride

V. Verlaan, C.H.M. van der Werf, W.M. Arnoldbik, H.D. Goldbach, R.E.I. Schropp

Research output: Contribution to journalMeeting AbstractOther research output

Original languageUndefined/Unknown
JournalPhysical review. B, Condensed matter and materials physics
VolumeB 73
Issue number195333-1-8
Publication statusPublished - 2006

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