Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging

D.A.M. de Winter, C.T.W.M. Schneijdenberg, M.N. Lebbink, B. Lich, A.J. Verkleij, M.R. Drury, B.M. Humbel

Research output: Contribution to journal › Article › Academic › peer-review

Keywords

@article{eacf63b5828042a8a7cb8c92d96a5315,

title = "Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging",

keywords = "Aardwetenschappen/Geologie/Geofysica, Geology, Geowetenschappen en aanverwante (milieu)wetenschappen",

author = "{de Winter}, D.A.M. and C.T.W.M. Schneijdenberg and M.N. Lebbink and B. Lich and A.J. Verkleij and M.R. Drury and B.M. Humbel",

year = "2009",

language = "Undefined/Unknown",

volume = "233",

pages = "372--383",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Wiley-Blackwell Publishing Ltd",

number = "3",

}

TY - JOUR

T1 - Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging

AU - de Winter, D.A.M.

AU - Schneijdenberg, C.T.W.M.

AU - Lebbink, M.N.

AU - Lich, B.

AU - Verkleij, A.J.

AU - Drury, M.R.

AU - Humbel, B.M.

PY - 2009

Y1 - 2009

KW - Aardwetenschappen/Geologie/Geofysica

KW - Geology

KW - Geowetenschappen en aanverwante (milieu)wetenschappen

M3 - Article

SN - 0022-2720

VL - 233

SP - 372

EP - 383

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - 3

ER -