Three-dimensional analysis of wood structure: X--ray computed microtomography (microCT) of vessel networks and atomic force microscopy (AFM) of pit membranes

S JANSEN; A PLETSERS; Kathy Steppe; Veerle Cnudde; Bert Masschaele; B CHOAT; Y SANO; T PESACRETA; S CONNEL

Three-dimensional analysis of wood structure: X--ray computed microtomography (microCT) of vessel networks and atomic force microscopy (AFM) of pit membranes

S JANSEN, A PLETSERS, Kathy Steppe, Veerle Cnudde, Bert Masschaele, B CHOAT, Y SANO, T PESACRETA, S CONNEL

non-UU output of DES-UU members

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined/Unknown
Title of host publication	IAWA Pan American Regional Group meeting
Publication status	Published - 2007

Cite this

@inproceedings{1c7972003d334f0a9d98302bee569829,

title = "Three-dimensional analysis of wood structure: X--ray computed microtomography (microCT) of vessel networks and atomic force microscopy (AFM) of pit membranes",

author = "S JANSEN and A PLETSERS and Kathy Steppe and Veerle Cnudde and Bert Masschaele and B CHOAT and Y SANO and T PESACRETA and S CONNEL",

year = "2007",

language = "Undefined/Unknown",

booktitle = "IAWA Pan American Regional Group meeting",

}

Three-dimensional analysis of wood structure: X--ray computed microtomography (microCT) of vessel networks and atomic force microscopy (AFM) of pit membranes. / JANSEN, S; PLETSERS, A; Steppe, Kathy et al.
IAWA Pan American Regional Group meeting. 2007.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Three-dimensional analysis of wood structure: X--ray computed microtomography (microCT) of vessel networks and atomic force microscopy (AFM) of pit membranes

AU - JANSEN, S

AU - PLETSERS, A

AU - Steppe, Kathy

AU - Cnudde, Veerle

AU - Masschaele, Bert

AU - CHOAT, B

AU - SANO, Y

AU - PESACRETA, T

AU - CONNEL, S

PY - 2007

Y1 - 2007

M3 - Conference contribution

BT - IAWA Pan American Regional Group meeting

ER -