Temperature-dependent aluminum incorporation in AlxGa1 - xAs layers grown by metalorganic vapor phase epitaxy

  • W. G. J. H. M. van Sark
  • , G. J. H. M. Janssen
  • , M. H. J. M. de Croon
  • , X. Tang
  • , L. J. Giling
  • , W. M. Arnold Bik
  • , C. P. M. Dunselman
  • , F. H. P. M. Habraken
  • , W. F. van der Weg

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

The temperature-dependent behavior of the solid composition xs of AlxGa1-xAs has systematically been studied as a function of gas phase composition xg in an optimized horizontal metalorganic vapor phase epitaxy reactor at atmospheric pressure. Up to a temperature of 660 °C the Al incorporation is constant but slightly exceeds the Ga incorporation. Above this temperature the Al incorporation strongly increases with temperature. This behavior is most probably related to a change in growth mechanism from mass transport limited growth to a regime where the growth is controlled by thermodynamics, especially for the gallium species.
Original languageEnglish
Pages (from-to)195-199
JournalJournal of Applied Physics
Volume64
DOIs
Publication statusPublished - 1 Jul 1988

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