Temperature-dependent aluminum incorporation in AlxGa1 - xAs layers grown by metalorganic vapor phase epitaxy

W. G. J. H. M. van Sark, G. J. H. M. Janssen, M. H. J. M. de Croon, X. Tang, L. J. Giling, W. M. Arnold Bik, C. P. M. Dunselman, F. H. P. M. Habraken, W. F. van der Weg

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

The temperature-dependent behavior of the solid composition xs of AlxGa1-xAs has systematically been studied as a function of gas phase composition xg in an optimized horizontal metalorganic vapor phase epitaxy reactor at atmospheric pressure. Up to a temperature of 660 °C the Al incorporation is constant but slightly exceeds the Ga incorporation. Above this temperature the Al incorporation strongly increases with temperature. This behavior is most probably related to a change in growth mechanism from mass transport limited growth to a regime where the growth is controlled by thermodynamics, especially for the gallium species.
Original languageEnglish
Pages (from-to)195-199
JournalJournal of Applied Physics
Volume64
DOIs
Publication statusPublished - 1 Jul 1988

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