Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

A. V. Vasilieva; N. A. Grigoryeva; A. A. Mistonov; N. A. Sapoletova; K. S. Napolskii; A. A. Eliseev; A. V. Lukashin; Yu D. Tretyakov; A.V. Petukhov; D. Byelov; D. Chernyshov; A. I. Okorokov; W. G. Bouwman; S. V. Grigoriev

doi:10.1088/1742-6596/247/1/012029

Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

A. V. Vasilieva, N. A. Grigoryeva, A. A. Mistonov, N. A. Sapoletova, K. S. Napolskii, A. A. Eliseev, A. V. Lukashin, Yu D. Tretyakov, A.V. Petukhov, D. Byelov, D. Chernyshov, A. I. Okorokov, W. G. Bouwman, S. V. Grigoriev

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a₀ 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length L_tran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L _long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.

Original language	English
Article number	012029
Journal	Journal of Physics: Conference Series
Volume	247
DOIs	https://doi.org/10.1088/1742-6596/247/1/012029
Publication status	Published - 2010

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Vasilieva, A. V., Grigoryeva, N. A., Mistonov, A. A., Sapoletova, N. A., Napolskii, K. S., Eliseev, A. A., Lukashin, A. V., Tretyakov, Y. D., Petukhov, A. V., Byelov, D., Chernyshov, D., Okorokov, A. I., Bouwman, W. G., & Grigoriev, S. V. (2010). Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction. Journal of Physics: Conference Series, 247, Article 012029. https://doi.org/10.1088/1742-6596/247/1/012029

@article{ba06e2026e88463ba3fea67acd4d5e32,

title = "Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction",

abstract = "Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.",

author = "Vasilieva, {A. V.} and Grigoryeva, {N. A.} and Mistonov, {A. A.} and Sapoletova, {N. A.} and Napolskii, {K. S.} and Eliseev, {A. A.} and Lukashin, {A. V.} and Tretyakov, {Yu D.} and A.V. Petukhov and D. Byelov and D. Chernyshov and Okorokov, {A. I.} and Bouwman, {W. G.} and Grigoriev, {S. V.}",

year = "2010",

doi = "10.1088/1742-6596/247/1/012029",

language = "English",

volume = "247",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP PUBLISHING LTD",

}

Vasilieva, AV, Grigoryeva, NA, Mistonov, AA, Sapoletova, NA, Napolskii, KS, Eliseev, AA, Lukashin, AV, Tretyakov, YD, Petukhov, AV, Byelov, D, Chernyshov, D, Okorokov, AI, Bouwman, WG & Grigoriev, SV 2010, 'Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction', Journal of Physics: Conference Series, vol. 247, 012029. https://doi.org/10.1088/1742-6596/247/1/012029

TY - JOUR

T1 - Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

AU - Vasilieva, A. V.

AU - Grigoryeva, N. A.

AU - Mistonov, A. A.

AU - Sapoletova, N. A.

AU - Napolskii, K. S.

AU - Eliseev, A. A.

AU - Lukashin, A. V.

AU - Tretyakov, Yu D.

AU - Petukhov, A.V.

AU - Byelov, D.

AU - Chernyshov, D.

AU - Okorokov, A. I.

AU - Bouwman, W. G.

AU - Grigoriev, S. V.

PY - 2010

Y1 - 2010

N2 - Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.

AB - Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.

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DO - 10.1088/1742-6596/247/1/012029

M3 - Article

AN - SCOPUS:78651102848

SN - 1742-6588

VL - 247

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

M1 - 012029

ER -

Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

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