Structure of mixed-phase Si films studied by C-AFM and X-TEM

T. Mates, P.C.P. Bronsveld, A. Fejfar, B. Rezek, J. Kocka, J.K. Rath, R.E.I. Schropp

Research output: Contribution to journal › Meeting Abstract › Other research output

Original language	Undefined/Unknown
Journal	Journal of physics. Condensed matter
Publication status	Published - 2006

Cite this

@article{7507fdeedcbd4d6895284043caeb823a,

title = "Structure of mixed-phase Si films studied by C-AFM and X-TEM",

author = "T. Mates and P.C.P. Bronsveld and A. Fejfar and B. Rezek and J. Kocka and J.K. Rath and R.E.I. Schropp",

year = "2006",

language = "Undefined/Unknown",

journal = "Journal of physics. Condensed matter",

issn = "0953-8984",

publisher = "IOP PUBLISHING LTD",

}