Abstract
We present a cross-sectional transmission electron microscopy study of a set of hydrogenated nano-crystalline silicon n–i–p solar cells deposited by hot-wire chemical vapour deposition on Corning glass substrates coated with ZnO-covered Ag layers with various surface roughnesses. Strip-like structural defects (voids and low-density areas) are observed in the silicon layers originating from micro-valleys of Ag grains. A correlation between the opening angles of the textured surface and the appearance of these strips was found. We propose that in order to grow high-quality hydrogenated nano-crystalline silicon absorber layers for solar cell applications, the morphology of the Ag surface is a critical property, and the micro-valleys at the ZnO surface with an opening angle smaller than around 110° should be avoided.
Original language | Undefined/Unknown |
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Pages (from-to) | 338-349 |
Number of pages | 12 |
Journal | Solar Energy Materials and Solar Cells |
Volume | 93 |
Issue number | 3 |
Publication status | Published - 2009 |