STEM education in Flanders : literacy and a positive attitude towards STEM

Heidi Knipprath; Lieve Thibaut; Marie-Paule Buyse; Stijn Ceuppens; Haydée De Loof; Jolien De Meester; Leen Goovaerts; Annemie Struyf; Jelle Boeve-de Pauw; Fien De Paepe; Johan Deprez; Mieke De Cock; Luc Hellinckx; Greet Langie; Katrien Struyven; Didier Van De Velde; Peter Van Petegem; Wim Dehaene

doi:10.1109/MIM.2018.8360917

STEM education in Flanders : literacy and a positive attitude towards STEM

Heidi Knipprath, Lieve Thibaut, Marie-Paule Buyse, Stijn Ceuppens, Haydée De Loof, Jolien De Meester, Leen Goovaerts, Annemie Struyf, Jelle Boeve-de Pauw, Fien De Paepe, Johan Deprez, Mieke De Cock, Luc Hellinckx, Greet Langie, Katrien Struyven, Didier Van De Velde, Peter Van Petegem, Wim Dehaene

Extern UU FSW

extern

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	36-40
Number of pages	5
Journal	IEEE Instrumentation and Measurement Magazine
Volume	21
Issue number	3
DOIs	https://doi.org/10.1109/MIM.2018.8360917
Publication status	Published - 2018

Access to Document

10.1109/MIM.2018.8360917

https://hdl.handle.net/10067/1514000151162165141

Cite this

Knipprath, H., Thibaut, L., Buyse, M.-P., Ceuppens, S., De Loof, H., De Meester, J., Goovaerts, L., Struyf, A., Boeve-de Pauw, J., De Paepe, F., Deprez, J., De Cock, M., Hellinckx, L., Langie, G., Struyven, K., Van De Velde, D., Van Petegem, P., & Dehaene, W. (2018). STEM education in Flanders : literacy and a positive attitude towards STEM. IEEE Instrumentation and Measurement Magazine, 21(3), 36-40. https://doi.org/10.1109/MIM.2018.8360917

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title = "STEM education in Flanders : literacy and a positive attitude towards STEM",

author = "Heidi Knipprath and Lieve Thibaut and Marie-Paule Buyse and Stijn Ceuppens and {De Loof}, Hayd{\'e}e and {De Meester}, Jolien and Leen Goovaerts and Annemie Struyf and {Boeve-de Pauw}, Jelle and {De Paepe}, Fien and Johan Deprez and {De Cock}, Mieke and Luc Hellinckx and Greet Langie and Katrien Struyven and {Van De Velde}, Didier and {Van Petegem}, Peter and Wim Dehaene",

year = "2018",

doi = "10.1109/MIM.2018.8360917",

language = "English",

volume = "21",

pages = "36--40",

journal = "IEEE Instrumentation and Measurement Magazine",

issn = "1094-6969",

publisher = "IEEE",

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Knipprath, H, Thibaut, L, Buyse, M-P, Ceuppens, S, De Loof, H, De Meester, J, Goovaerts, L, Struyf, A , Boeve-de Pauw, J, De Paepe, F, Deprez, J, De Cock, M, Hellinckx, L, Langie, G, Struyven, K, Van De Velde, D, Van Petegem, P & Dehaene, W 2018, 'STEM education in Flanders : literacy and a positive attitude towards STEM', IEEE Instrumentation and Measurement Magazine, vol. 21, no. 3, pp. 36-40. https://doi.org/10.1109/MIM.2018.8360917

TY - JOUR

T1 - STEM education in Flanders : literacy and a positive attitude towards STEM

AU - Knipprath, Heidi

AU - Thibaut, Lieve

AU - Buyse, Marie-Paule

AU - Ceuppens, Stijn

AU - De Loof, Haydée

AU - De Meester, Jolien

AU - Goovaerts, Leen

AU - Struyf, Annemie

AU - Boeve-de Pauw, Jelle

AU - De Paepe, Fien

AU - Deprez, Johan

AU - De Cock, Mieke

AU - Hellinckx, Luc

AU - Langie, Greet

AU - Struyven, Katrien

AU - Van De Velde, Didier

AU - Van Petegem, Peter

AU - Dehaene, Wim

PY - 2018

Y1 - 2018

U2 - 10.1109/MIM.2018.8360917

DO - 10.1109/MIM.2018.8360917

M3 - Article

SN - 1094-6969

VL - 21

SP - 36

EP - 40

JO - IEEE Instrumentation and Measurement Magazine

JF - IEEE Instrumentation and Measurement Magazine

IS - 3

ER -