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Stacking it up: Exploring the limits of ultra-high resolution atomic force microscopy
N.J. van der Heijden
Sub Condensed Matter and Interfaces
Condensed Matter and Interfaces
Research output
:
Thesis
›
Doctoral thesis 1 (Research UU / Graduation UU)
Overview
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Keyphrases
Atomic Force Microscopy
100%
Ultra-high Resolution
100%
Electronic Devices
20%
Single Molecule
20%
Piconewton
20%
Atomic Scale
20%
Chemical Industry
20%
Atomic Resolution
20%
Raster Scanning
20%
Lateral Resolution
20%
Submolecular Resolution
20%
Sharp Needle
20%
Picometer
20%
Engineering
Atomic Force Microscopy
100%
High Resolution
100%
Measured Force
20%
Lateral Resolution
20%
Chemistry
Atomic Force Microscopy
100%
Chemical Industry
20%
electronics
20%
Material Science
Atomic Force Microscopy
100%
Surface (Surface Science)
40%