Spectral X-ray computed micro tomography: 3-dimensional chemical imaging

Jonathan Sittner; Jose R. A. Godinho; Axel D. Renno; Veerle Cnudde; Marijn Boone; Thomas De Schryver; Denis Van Loo; Margarita Merkulova; Antti Roine; Jussi Liipo

doi:10.1002/xrs.3200

Spectral X-ray computed micro tomography: 3-dimensional chemical imaging

Jonathan Sittner, Jose R. A. Godinho, Axel D. Renno, Veerle Cnudde, Marijn Boone, Thomas De Schryver, Denis Van Loo, Margarita Merkulova, Antti Roine, Jussi Liipo

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

We present a new approach to 3-dimensional chemical imaging based on X-ray computed micro tomography (CT), which enables the analysis of the internal elemental chemistry. The method uses a conventional laboratory-based CT scanner equipped with a semiconductor detector (CdTe). Based on the X-ray absorption spectra, elements in a sample can be distinguished by their specific K-edge energy. The capabilities and performance of this new approach are illustrated with different experiments, i.e. single pure element particle measurements, element differentiation in mixtures, and mineral differentiation in a natural rock sample. The results show that the method can distinguish elements with K-edges in the range of 20 to 160 keV, this corresponds to an element range from Ag to U. Furthermore, the spectral information allows a distinction between materials, which show little variation in contrast in the reconstructed CT image.

Original language	English
Pages (from-to)	92-105
Number of pages	14
Journal	X-Ray Spectrometry
Volume	50
Issue number	2
DOIs	https://doi.org/10.1002/xrs.3200
Publication status	Published - 1 Mar 2021

Bibliographical note

Funding Information:
This research is part of the upscaling project “Resource Characterization: from 2D to 3D microscopy” and has received funding from the European Institute of Innovation and Technology (EIT), a body of the European Union, under the Horizon 2020, the EU Framework Program for Research and Innovation. Open access funding enabled and organized by Projekt DEAL.

Publisher Copyright:
© 2020 The Authors. X-Ray Spectrometry published by John Wiley & Sons Ltd.

Keywords

3D imaging
CT
mineral classification
photon-counting detector
spectral X-ray tomography

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xrs.3200Final published version, 3.43 MBLicence: CC BY-NC

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title = "Spectral X-ray computed micro tomography: 3-dimensional chemical imaging",

abstract = "We present a new approach to 3-dimensional chemical imaging based on X-ray computed micro tomography (CT), which enables the analysis of the internal elemental chemistry. The method uses a conventional laboratory-based CT scanner equipped with a semiconductor detector (CdTe). Based on the X-ray absorption spectra, elements in a sample can be distinguished by their specific K-edge energy. The capabilities and performance of this new approach are illustrated with different experiments, i.e. single pure element particle measurements, element differentiation in mixtures, and mineral differentiation in a natural rock sample. The results show that the method can distinguish elements with K-edges in the range of 20 to 160 keV, this corresponds to an element range from Ag to U. Furthermore, the spectral information allows a distinction between materials, which show little variation in contrast in the reconstructed CT image.",

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note = "Funding Information: This research is part of the upscaling project “Resource Characterization: from 2D to 3D microscopy” and has received funding from the European Institute of Innovation and Technology (EIT), a body of the European Union, under the Horizon 2020, the EU Framework Program for Research and Innovation. Open access funding enabled and organized by Projekt DEAL. Publisher Copyright: {\textcopyright} 2020 The Authors. X-Ray Spectrometry published by John Wiley & Sons Ltd.",

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doi = "10.1002/xrs.3200",

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AU - Van Loo, Denis

AU - Merkulova, Margarita

AU - Roine, Antti

AU - Liipo, Jussi

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PY - 2021/3/1

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N2 - We present a new approach to 3-dimensional chemical imaging based on X-ray computed micro tomography (CT), which enables the analysis of the internal elemental chemistry. The method uses a conventional laboratory-based CT scanner equipped with a semiconductor detector (CdTe). Based on the X-ray absorption spectra, elements in a sample can be distinguished by their specific K-edge energy. The capabilities and performance of this new approach are illustrated with different experiments, i.e. single pure element particle measurements, element differentiation in mixtures, and mineral differentiation in a natural rock sample. The results show that the method can distinguish elements with K-edges in the range of 20 to 160 keV, this corresponds to an element range from Ag to U. Furthermore, the spectral information allows a distinction between materials, which show little variation in contrast in the reconstructed CT image.

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Spectral X-ray computed micro tomography: 3-dimensional chemical imaging

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