Spatially resolved photoconductive properties of profiled polycrystalline silicon thin films

T.J. Savenije, P.A.T.T. van Veenendaal, M.P. de Haas, J.M. Warman, J.K. Rath, R.E.I. Schropp

Research output: Contribution to journal › Article › Academic › peer-review

Cite this

@article{24fe98d6b5394b7cb69095d4292de95c,

title = "Spatially resolved photoconductive properties of profiled polycrystalline silicon thin films",

author = "T.J. Savenije and {van Veenendaal}, P.A.T.T. and {de Haas}, M.P. and J.M. Warman and J.K. Rath and R.E.I. Schropp",

year = "2002",

language = "Undefined/Unknown",

volume = "91",

pages = "5671--5676",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "9",

}

TY - JOUR

T1 - Spatially resolved photoconductive properties of profiled polycrystalline silicon thin films

AU - Savenije, T.J.

AU - van Veenendaal, P.A.T.T.

AU - de Haas, M.P.

AU - Warman, J.M.

AU - Rath, J.K.

AU - Schropp, R.E.I.

PY - 2002

Y1 - 2002

M3 - Article

SN - 0021-8979

VL - 91

SP - 5671

EP - 5676

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9

ER -