{S}hape {R}etrieval {C}ontest {(SHREC)} 2008

R.C. Veltkamp, F.B. ter Haar

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationProceedings IEEE Shape Modeling International (SMI)
Pages215-216
Number of pages2
Publication statusPublished - 2008

Keywords

  • Wiskunde en Informatica (WIIN)

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