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Scanning Transmission X-Ray Microscopy as a Novel Tool to Probe Colloidal and Photonic Crystals

  • University of California Office of the President
  • University of Saskatchewan

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Photonic crystals consisting of nano-to micrometer-sized building blocks, such as multiple sorts of colloids, have recently received widespread attention. It remains a challenge, however, to adequately probe the internal crystal structure and the corresponding deformations that inhibit the proper functioning of such materials. It is shown that scanning transmission X-ray microscopy (STXM) can directly reveal the local structure, orientations, and even deformations in polystyrene and silica colloidal crystals with 30-nm spatial resolution. Moreover, STXM is capable of imaging a diverse range of crystals, including those that are dry and inverted, and provides novel insights complementary to information obtained by benchmark confocal fluorescence and scanning electron microscopy techniques.

Original languageEnglish
Pages (from-to)804-811
Number of pages8
JournalSmall: nano micro
Volume7
Issue number6
DOIs
Publication statusPublished - 21 Mar 2011

Funding

This work was financially supported by a VICI grant (FMFdG) of the Netherlands Organization for Scientific Research (NWO-CW). Sandy Heinen is acknowledged for polystyrene particle synthesis. We thank beamline 11.0.2. of the ALS and beamline 10ID-1 (SM) at the CLS for beam time and support. The ALS is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. The CLS is supported by the Natural Sciences and Engineering Research Council of Canada, the National Research Council Canada, the Canadian Institutes of Health Research, the Province of Saskatchewan, Western Economic Diversification Canada, and the University of Saskatchewan.

Keywords

  • ADVANCED LIGHT-SOURCE
  • ABSORPTION SPECTROSCOPY
  • CATALYTIC SOLIDS
  • STACKING-FAULTS
  • RESOLUTION
  • SPHERES
  • SPECTROMICROSCOPY
  • DIFFRACTION
  • THICKNESS
  • EMISSION

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