Scanning Probe Microscopy and Spectroscopy

Peter Liljeroth; B. Grandidier; Christophe Delerue; Daniel Vanmaekelbergh

doi:10.1007/978-3-662-44823-6_8

Scanning Probe Microscopy and Spectroscopy

Peter Liljeroth, B. Grandidier, Christophe Delerue, Daniel Vanmaekelbergh

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Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Abstract

This chapter shows how scanning tunneling microscopy and spectroscopy and atomic force microscopy can be used to measure the properties of individual nanocrystals, thereby circumventing the limitations of ensemble based measurements.

Original language	English
Title of host publication	Nanoparticles
Subtitle of host publication	Workhorses of Nanoscience
Editors	Celso de Mello Donegá
Publisher	Springer
Pages	223-255
Number of pages	33
ISBN (Electronic)	978-3-662-44823-6
ISBN (Print)	978-3-662-44822-9
DOIs	https://doi.org/10.1007/978-3-662-44823-6_8
Publication status	Published - 2014

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Scanning Probe Microscopy and Spectroscopy

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