Resolution enhancement of wide-field fluorescence microscopy with a scattering lens

Hasan Yilmaz, Elbert G. van Putten, Jacopo Bertolotti, Ad Lagendijk, Willem L. Vos, Allard P. Mosk

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Fluorescence microscopy is invaluable in materials science and life sciences. Due to the diffraction limit conventional microscopy systems are not capable of resolving structures that are smaller than roughly 200 nm. A breakthrough in fluorescence microscopy was recently achieved by nonlinear optical phenomena for high-resolution imaging. With dyes with specific photophysics the diffraction limit can be circumvented to yield sub-200 nm resolution [1-3]. However, such dyes are not always suited for labeling the structures of interest.
Original languageEnglish
Title of host publicationProceedings 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference, CLEO/Europe-EQEC 2015
PublisherOptical Society of America (OSA)
ISBN (Electronic)9781467374750
Publication statusPublished - 2015
Event2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference, CLEO/Europe-EQEC 2015 - Munich, Germany
Duration: 21 Jun 201525 Jun 2015

Conference

Conference2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference, CLEO/Europe-EQEC 2015
Country/TerritoryGermany
CityMunich
Period21/06/1525/06/15

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