TY - GEN
T1 - Residual stress gradient analysis by multiple diffraction line methods
AU - Genzel, Christoph
AU - Apel, Daniel
AU - Klaus, Manuela
AU - Genzel, Martin
AU - Balzar, Davor
PY - 2014/1/1
Y1 - 2014/1/1
N2 - The paper deals with methods for X-ray stress analysis (XSA), which allow for the evaluation of near surface in-plane residual stress gradients σ||(τ) and σ||(z) in the LAPLACE- and the real space, respectively. Since the 'robustness' of residual stress gradient analysis strongly depends on both, the quality of the measured strain data and the number of experimental data points, the discussion aims at those approaches which are based on processing various diffraction lines or even complete diffraction patterns. It is shown that these techniques, which were originally developed for angle-dispersive (AD) diffraction, can be adapted and enhanced for energy-dispersive (ED) diffraction employing high-energy synchrotron radiation. With the example of a shot-peened ferritic steel it is demonstrated, that sin2ψ-data measured in the Ψ-mode of XSA employing the ED diffraction technique can be analyzed on different levels of approximation.
AB - The paper deals with methods for X-ray stress analysis (XSA), which allow for the evaluation of near surface in-plane residual stress gradients σ||(τ) and σ||(z) in the LAPLACE- and the real space, respectively. Since the 'robustness' of residual stress gradient analysis strongly depends on both, the quality of the measured strain data and the number of experimental data points, the discussion aims at those approaches which are based on processing various diffraction lines or even complete diffraction patterns. It is shown that these techniques, which were originally developed for angle-dispersive (AD) diffraction, can be adapted and enhanced for energy-dispersive (ED) diffraction employing high-energy synchrotron radiation. With the example of a shot-peened ferritic steel it is demonstrated, that sin2ψ-data measured in the Ψ-mode of XSA employing the ED diffraction technique can be analyzed on different levels of approximation.
KW - Energy-dispersive diffraction
KW - Laplace space methods
KW - Residual stress gradients
KW - Rietveld refinement
KW - Synchrotron radiation
UR - http://www.scopus.com/inward/record.url?scp=84886055841&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.768-769.3
DO - 10.4028/www.scientific.net/MSF.768-769.3
M3 - Conference contribution
AN - SCOPUS:84886055841
SN - 9783037858493
T3 - Materials Science Forum
SP - 3
EP - 18
BT - International Conference on Residual Stresses 9 (ICRS 9)
PB - Trans Tech Publications Ltd
T2 - 9th International Conference on Residual Stresses, ICRS 2012
Y2 - 7 October 2012 through 9 October 2012
ER -