Residual stress gradient analysis by multiple diffraction line methods

Christoph Genzel, Daniel Apel, Manuela Klaus, Martin Genzel, Davor Balzar

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The paper deals with methods for X-ray stress analysis (XSA), which allow for the evaluation of near surface in-plane residual stress gradients σ||(τ) and σ||(z) in the LAPLACE- and the real space, respectively. Since the 'robustness' of residual stress gradient analysis strongly depends on both, the quality of the measured strain data and the number of experimental data points, the discussion aims at those approaches which are based on processing various diffraction lines or even complete diffraction patterns. It is shown that these techniques, which were originally developed for angle-dispersive (AD) diffraction, can be adapted and enhanced for energy-dispersive (ED) diffraction employing high-energy synchrotron radiation. With the example of a shot-peened ferritic steel it is demonstrated, that sin2ψ-data measured in the Ψ-mode of XSA employing the ED diffraction technique can be analyzed on different levels of approximation.

Original languageEnglish
Title of host publicationInternational Conference on Residual Stresses 9 (ICRS 9)
PublisherTrans Tech Publications Ltd
Pages3-18
Number of pages16
ISBN (Print)9783037858493
DOIs
Publication statusPublished - 1 Jan 2014
Event9th International Conference on Residual Stresses, ICRS 2012 - Garmisch-Partenkirchen, Germany
Duration: 7 Oct 20129 Oct 2012

Publication series

NameMaterials Science Forum
Volume768-769
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference9th International Conference on Residual Stresses, ICRS 2012
Country/TerritoryGermany
CityGarmisch-Partenkirchen
Period7/10/129/10/12

Keywords

  • Energy-dispersive diffraction
  • Laplace space methods
  • Residual stress gradients
  • Rietveld refinement
  • Synchrotron radiation

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