Reliable and Efficient pattern matching using an afine invariant metric

M. Hagedoorn, R.C. Veltkamp

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)103-115
Number of pages114
JournalInternational Journal of Computer Vision
Volume31
Issue number2,3
Publication statusPublished - 1999

Keywords

  • Wiskunde en Informatica (WIIN)

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