Reliable and efficient pattern matching using an affine invariant metric

M. Hagedoorn, R.C. Veltkamp

Research output: Book/ReportReportAcademic

Original languageUndefined/Unknown
Place of PublicationUtrecht, the Netherlands
PublisherUtrecht University: Information and Computing Sciences
Volume1997-33
EditionUU-CS
ISBN (Print)0924-3275
Publication statusPublished - 1997

Keywords

  • Wiskunde en Informatica (WIIN)

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