Abstract
We present extended x-ray absorption fine structure (EXAFS) data at the La L-2 edge in LaOCl that were recorded on the L beta(1) fluorescence line with an analyzer energy bandwidth of 1.3 eV. We show that by taking advantage of the high-energy-resolution fluorescence detection (HERFD) it is possible to extend the energy range for L-2 EXAFS analysis beyond the L-1 edge if the sample is optically thin. The arguments presented here generally apply to fluorescence-detected absorption spectroscopy if the fluorescence lines are sufficiently separated in energy. Calculations using an atomic multiplet model show that intensity due to 2p4d multiple-electron excitations is reduced in HERFD spectra. The technique has the potential of considerably improving EXAFS analyses at low energies (<10 keV) when absorption edges lie within a few hundred electron volts.
Original language | English |
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Article number | 014117 |
Number of pages | 7 |
Journal | Physical review. B, Condensed matter and materials physics |
Volume | 72 |
Issue number | 1 |
DOIs | |
Publication status | Published - Jul 2005 |
Keywords
- ABSORPTION FINE-STRUCTURE
- SPECTROSCOPY
- CATALYSTS
- SPECTRA
- SYSTEMS