Range-extended EXAFS at the L edge of rare earths using high-energy-resolution fluorescence detection: A study of La in LaOCl

P Glatzel*, FMF de Groot, O Manoilova, D Grandjean, BM Weckhuysen, U Bergmann, R Barrea

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

We present extended x-ray absorption fine structure (EXAFS) data at the La L-2 edge in LaOCl that were recorded on the L beta(1) fluorescence line with an analyzer energy bandwidth of 1.3 eV. We show that by taking advantage of the high-energy-resolution fluorescence detection (HERFD) it is possible to extend the energy range for L-2 EXAFS analysis beyond the L-1 edge if the sample is optically thin. The arguments presented here generally apply to fluorescence-detected absorption spectroscopy if the fluorescence lines are sufficiently separated in energy. Calculations using an atomic multiplet model show that intensity due to 2p4d multiple-electron excitations is reduced in HERFD spectra. The technique has the potential of considerably improving EXAFS analyses at low energies (<10 keV) when absorption edges lie within a few hundred electron volts.

Original languageEnglish
Article number014117
Number of pages7
JournalPhysical review. B, Condensed matter and materials physics
Volume72
Issue number1
DOIs
Publication statusPublished - Jul 2005

Keywords

  • ABSORPTION FINE-STRUCTURE
  • SPECTROSCOPY
  • CATALYSTS
  • SPECTRA
  • SYSTEMS

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