Quantitative characterization of pore corrugation in ordered mesoporous materials using image analysis of electron tomograms

C.J. Gommes; H. Friedrich; M. Wolters; P.E. de Jongh; K.P. de Jong

Quantitative characterization of pore corrugation in ordered mesoporous materials using image analysis of electron tomograms

C.J. Gommes, H. Friedrich, M. Wolters, P.E. de Jongh, K.P. de Jong

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

Electron tomography and image analysis are combined to characterize ordered mesoporous silica SBA-15. The morphology of the mesopores with average diameter 6 nm is analyzed in terms of cylinders having variable radii and centers that are statistically centered on the points of a distorted hexagonal lattice. The variations in the mesopore centers and radii add up and result in pore wall corrugation with amplitude of 1.6 nm. The correlation length of the corrugation along the pore axis was found to be 4−5 nm. The amplitude of the corrugation compared well with the 1.9 nm thick microporous corona obtained from X-ray diffraction (XRD). In general, the present approach provides a detailed microscopic 3D model of nanostructured materials that complements macroscopic measurements such as physisorption and XRD.

Original language	Undefined/Unknown
Pages (from-to)	1311-1317
Number of pages	7
Journal	Chemistry of Materials
Volume	21
Issue number	7
Publication status	Published - 2009

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@article{6ef56001cde8422eafe73fc413f35680,

title = "Quantitative characterization of pore corrugation in ordered mesoporous materials using image analysis of electron tomograms",

abstract = "Electron tomography and image analysis are combined to characterize ordered mesoporous silica SBA-15. The morphology of the mesopores with average diameter 6 nm is analyzed in terms of cylinders having variable radii and centers that are statistically centered on the points of a distorted hexagonal lattice. The variations in the mesopore centers and radii add up and result in pore wall corrugation with amplitude of 1.6 nm. The correlation length of the corrugation along the pore axis was found to be 4−5 nm. The amplitude of the corrugation compared well with the 1.9 nm thick microporous corona obtained from X-ray diffraction (XRD). In general, the present approach provides a detailed microscopic 3D model of nanostructured materials that complements macroscopic measurements such as physisorption and XRD.",

author = "C.J. Gommes and H. Friedrich and M. Wolters and {de Jongh}, P.E. and {de Jong}, K.P.",

year = "2009",

language = "Undefined/Unknown",

volume = "21",

pages = "1311--1317",

journal = "Chemistry of Materials",

issn = "0897-4756",

publisher = "American Chemical Society",

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TY - JOUR

T1 - Quantitative characterization of pore corrugation in ordered mesoporous materials using image analysis of electron tomograms

AU - Gommes, C.J.

AU - Friedrich, H.

AU - Wolters, M.

AU - de Jongh, P.E.

AU - de Jong, K.P.

PY - 2009

Y1 - 2009

N2 - Electron tomography and image analysis are combined to characterize ordered mesoporous silica SBA-15. The morphology of the mesopores with average diameter 6 nm is analyzed in terms of cylinders having variable radii and centers that are statistically centered on the points of a distorted hexagonal lattice. The variations in the mesopore centers and radii add up and result in pore wall corrugation with amplitude of 1.6 nm. The correlation length of the corrugation along the pore axis was found to be 4−5 nm. The amplitude of the corrugation compared well with the 1.9 nm thick microporous corona obtained from X-ray diffraction (XRD). In general, the present approach provides a detailed microscopic 3D model of nanostructured materials that complements macroscopic measurements such as physisorption and XRD.

AB - Electron tomography and image analysis are combined to characterize ordered mesoporous silica SBA-15. The morphology of the mesopores with average diameter 6 nm is analyzed in terms of cylinders having variable radii and centers that are statistically centered on the points of a distorted hexagonal lattice. The variations in the mesopore centers and radii add up and result in pore wall corrugation with amplitude of 1.6 nm. The correlation length of the corrugation along the pore axis was found to be 4−5 nm. The amplitude of the corrugation compared well with the 1.9 nm thick microporous corona obtained from X-ray diffraction (XRD). In general, the present approach provides a detailed microscopic 3D model of nanostructured materials that complements macroscopic measurements such as physisorption and XRD.

M3 - Article

SN - 0897-4756

VL - 21

SP - 1311

EP - 1317

JO - Chemistry of Materials

JF - Chemistry of Materials

IS - 7

ER -