Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Nonreactive AFM Probes

Mark P. Boneschanscher, Joost van der Lit, Zhixiang Sun, Ingmar Swart, Peter Liljeroth*, Daniel Vanmaekelbergh

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Material Science