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P.STAR: Parameter-free Structure Analysis via Reordering for Lossless Visualization of Layers in Language Models

  • Mennatallah El-Assady*
  • , Antske Fokkens
  • , Pantea Haghighatkhah
  • , Tim Ophelders
  • , Pia Sommerauer
  • , Bettina Speckmann
  • , Kevin Verbeek
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

We introduce P.STAR: a new parameter-free method that can be used to inspect the embedding space of a set of instance representations (e.g. words in context) across layers of a contextualized language model at one glance and without loss of information. We use a matrix reordering approach that relies on signature distances; instances are represented in terms of their distances to all other instances in the set. The reordered matrix of signature representations provides a visual depiction of how structures emerge across layers of a contextualized model. We validate our approach by comparing how words in context are grouped to their PoS and Sense labels in two annotated datasets. In line with previous research, we observe that lower-layer representations emphasize PoS-information while higher layers group instances on the basis of senses. We also show that our reordering approach can identify errors in the labels.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE Workshop on Visualization for the Digital Humanities, VIS4DH 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages44-49
Number of pages6
ISBN (Electronic)9798331580377
DOIs
Publication statusPublished - 2025
Event2025 IEEE Workshop on Visualization for the Digital Humanities, VIS4DH 2025 - Vienna, Austria
Duration: 2 Nov 2025 → …

Publication series

NameProceedings - 2025 IEEE Workshop on Visualization for the Digital Humanities, VIS4DH 2025

Conference

Conference2025 IEEE Workshop on Visualization for the Digital Humanities, VIS4DH 2025
Country/TerritoryAustria
CityVienna
Period2/11/25 → …

Bibliographical note

Publisher Copyright:
© 2025 IEEE.

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