Abstract
The onset of exciton condensation in a topological insulator thin film was recently predicted. We calculate the critical temperature for this transition, taking into account screening effects. Furthermore, we show that the proximity to this transition can be probed by measuring the Coulomb drag resistivity between the surfaces of the thin film as a function of temperature. This resistivity shows an upturn upon approaching the exciton-condensed state.
| Original language | English |
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| Article number | 186402 |
| Pages (from-to) | 186402-1-186402-5 |
| Number of pages | 5 |
| Journal | Physical Review Letters |
| Volume | 108 |
| DOIs | |
| Publication status | Published - 1 May 2012 |