Abstract
The anodic electrochemistry and etching of the group IV compound semiconductor SiC was studied in both KOH and acidic fluoride solutions. The results for p-type and n-type electrodes are compared with those obtained for the group IV elemental semiconductor Si. We point out a number of interesting applications of this work for SiC device technology.
Original language | Undefined/Unknown |
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Pages (from-to) | 513-524 |
Number of pages | 15 |
Journal | ECS Transactions |
Volume | 6 |
Issue number | 2 |
Publication status | Published - 2007 |