| Original language | Undefined/Unknown |
|---|---|
| Journal | Tijdschrift: tijdelijk onbekend |
| Publication status | Published - 2006 |
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Optical Characterisation of a-Si:H and nc-Si:H thin films using the transmission spectrum alone
- S. Halindintwali
- , D. Knoesen
- , T.F.G. Muller
- , D. Adams
- , N. Tile
- , C.C. Theron
- , R.E.I. Schropp
Research output: Contribution to journal › Meeting Abstract › Other research output