Optical Characterisation of a-Si:H and nc-Si:H thin films using the transmission spectrum alone

S. Halindintwali, D. Knoesen, T.F.G. Muller, D. Adams, N. Tile, C.C. Theron, R.E.I. Schropp

Research output: Contribution to journalMeeting AbstractOther research output

Original languageUndefined/Unknown
JournalTijdschrift: tijdelijk onbekend
Publication statusPublished - 2006

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