On the sensitivity of probabilistic networks to test reliability

L.C. van der Gaag, S. Renooij

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationProceedings of the Tenth International Conference on Information Processing and Management of Uncertainty in Knowledge-Based Systems
Pages1675-1682
Number of pages8
Publication statusPublished - 2004

Keywords

  • Wiskunde en Informatica (WIIN)

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