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On the estimation of stochastic parameters from deep seismic reflection data and its use in delineating lower crustal structure

  • S.F.A. Carpentier

    Research output: ThesisDoctoral thesis 1 (Research UU / Graduation UU)

    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Utrecht University
    Supervisors/Advisors
    • van der Hilst, R.D., Primary supervisor, External person
    • Roy Chowdhury, K., Co-supervisor
    Award date12 Nov 2007
    Place of PublicationUtrecht
    Publisher
    Print ISBNs978-90-5744-146-2
    Publication statusPublished - 12 Nov 2007

    Bibliographical note

    Geologica Ultraiectina, 281

    Keywords

    • Aardwetenschappen/Geologie/Geofysica
    • Geowetenschappen en aanverwante (milieu)wetenschappen
    • earth
    • geology
    • geophysics
    • seismology
    • seismic
    • reflection
    • statistics
    • random
    • fourier
    • correlation

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