On the estimation of stochastic parameters from deep seismic reflection data and its use in delineating lower crustal structure

S.F.A. Carpentier

Research output: ThesisDoctoral thesis 1 (Research UU / Graduation UU)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Utrecht University
Supervisors/Advisors
  • van der Hilst, R.D., Primary supervisor, External person
  • Roy Chowdhury, K., Co-supervisor
Award date12 Nov 2007
Place of PublicationUtrecht
Publisher
Print ISBNs978-90-5744-146-2
Publication statusPublished - 12 Nov 2007

Keywords

  • Aardwetenschappen/Geologie/Geofysica
  • Geowetenschappen en aanverwante (milieu)wetenschappen
  • earth
  • geology
  • geophysics
  • seismology
  • seismic
  • reflection
  • statistics
  • random
  • fourier
  • correlation

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