Noice induced by structural changes and carrier trapping in hydrogenated amorphous silicon

P.A.W.E. Verleg, O. Uca, J.I. Dijkhuis

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationNoise in physical systems and 1/f fluctuations
Editors Claes, Simoen
Place of PublicationSingapore
PublisherWorld Scienctific
Pages442
Number of pages1
Publication statusPublished - 1997

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