Negative log-likelihood and statistical hypothesis testing as the basis of model selection in IDEAs

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the Tenth Belgium-Netherlands Conference on Machine Learning
Editors	A. Feelders
Place of Publication	Tilburg
Publisher	Tilburg University
Pages	109-116
Number of pages	8
Publication status	Published - 2000

Keywords

@inproceedings{e8244f08d98b42e594bf2225c525e351,

title = "Negative log-likelihood and statistical hypothesis testing as the basis of model selection in IDEAs",

keywords = "Wiskunde en Informatica (WIIN)",

author = "P.A.N. Bosman and D. Thierens",

year = "2000",

language = "Undefined/Unknown",

pages = "109--116",

editor = "A. Feelders",

booktitle = "Proceedings of the Tenth Belgium-Netherlands Conference on Machine Learning",

publisher = "Tilburg University",

}

Negative log-likelihood and statistical hypothesis testing as the basis of model selection in IDEAs. / Bosman, P.A.N.; Thierens, D.
Proceedings of the Tenth Belgium-Netherlands Conference on Machine Learning. ed. / A. Feelders. Tilburg: Tilburg University, 2000. p. 109-116.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Negative log-likelihood and statistical hypothesis testing as the basis of model selection in IDEAs

AU - Bosman, P.A.N.

AU - Thierens, D.

PY - 2000

Y1 - 2000

KW - Wiskunde en Informatica (WIIN)

M3 - Conference contribution

SP - 109

EP - 116

BT - Proceedings of the Tenth Belgium-Netherlands Conference on Machine Learning

A2 - Feelders, A.

PB - Tilburg University

CY - Tilburg

ER -