Abstract
In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved
detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined
with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry
(SIMS) imaging. Time resolved images from various benchmark samples demonstrate the imaging
capabilities of the detector system. The main advantages of the active pixel detector are the
higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode
SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.
Original language | English |
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Pages (from-to) | 013704-1-013704-7 |
Number of pages | 7 |
Journal | Review of Scientific Instruments |
Volume | 84 |
DOIs | |
Publication status | Published - 2013 |