Measuring the development patterns of urban villages in Shenzhen

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	Undefined/Unknown
Title of host publication	Advancing Geoinformation Science for a Changing World
Editors	S. Geertman, W. Reinhardt, F. Toppen
Place of Publication	New York
Publisher	Springer
Number of pages	540
ISBN (Print)	978-3-642-19788-8
Publication status	Published - 2011

Name	Lecture Notes in Geoinformation and Cartography

Cite this

@inbook{ce9d6efb595f4925897211c39546c859,

title = "Measuring the development patterns of urban villages in Shenzhen",

author = "P. Hao and S.C.M. Geertman and P. Hooimeijer and R. Sliuzas",

year = "2011",

language = "Undefined/Unknown",

isbn = "978-3-642-19788-8",

series = "Lecture Notes in Geoinformation and Cartography",

publisher = "Springer",

editor = "S. Geertman and W. Reinhardt and F. Toppen",

booktitle = "Advancing Geoinformation Science for a Changing World",

}

Measuring the development patterns of urban villages in Shenzhen. / Hao, P.; Geertman, S.C.M.; Hooimeijer, P. et al.
Advancing Geoinformation Science for a Changing World. ed. / S. Geertman; W. Reinhardt; F. Toppen. New York: Springer, 2011. (Lecture Notes in Geoinformation and Cartography).

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

TY - CHAP

T1 - Measuring the development patterns of urban villages in Shenzhen

AU - Hao, P.

AU - Geertman, S.C.M.

AU - Hooimeijer, P.

AU - Sliuzas, R.

PY - 2011

Y1 - 2011

M3 - Chapter

SN - 978-3-642-19788-8

T3 - Lecture Notes in Geoinformation and Cartography

BT - Advancing Geoinformation Science for a Changing World

A2 - Geertman, S.

A2 - Reinhardt, W.

A2 - Toppen, F.

PB - Springer

CY - New York

ER -