Measure twice, cut once: entrepreneurial ecosystem metrics

J. Leendertse; M.T. Schrijvers; F.C. Stam

Measure twice, cut once: entrepreneurial ecosystem metrics

J. Leendertse
, M.T. Schrijvers
, F.C. Stam

Research output: Contribution to conference › Paper › Academic

Original language	English
Publication status	Published - 2020
Event	36th EGOS Colloquim: Organizing for a Sustainable Future: Responsibility, Renewal & Resistance - Online Duration: 2 Jul 2020 → 4 Jul 2020

Conference

Conference	36th EGOS Colloquim
Period	2/07/20 → 4/07/20

Keywords

valorisation

Cite this

@conference{cf4fb80298494213995e6c4ae4775093,

title = "Measure twice, cut once: entrepreneurial ecosystem metrics",

keywords = "valorisation",

author = "J. Leendertse and M.T. Schrijvers and F.C. Stam",

year = "2020",

language = "English",

note = "36th EGOS Colloquim : Organizing for a Sustainable Future: Responsibility, Renewal \& Resistance ; Conference date: 02-07-2020 Through 04-07-2020",

}