Abstract
In this paper we develop a numerical method for solving an inverse scattering problem of estimating the scattering potential in a Schrödinger equation from frequency domain measurements based on reduced order models (ROM). The ROM is a projection of the Schrödinger operator onto a subspace spanned by its solution snapshots at certain wavenumbers. Provided the measurements are performed at these wavenumbers, the ROM can be constructed in a data-driven manner from the measurements on a surface surrounding the scatterers. Once the ROM is computed, the scattering potential can be estimated using nonlinear optimization that minimizes the ROM misfit. Such an approach typically outperforms the conventional methods based on data misfit minimization. We develop two variants of ROM-based algorithms for inverse scattering and test them on a synthetic example in two spatial dimensions.
| Original language | English |
|---|---|
| Pages (from-to) | 2429-2457 |
| Number of pages | 29 |
| Journal | SIAM Journal on Imaging Sciences |
| Volume | 18 |
| Issue number | 4 |
| Early online date | 6 Nov 2025 |
| DOIs | |
| Publication status | Published - Dec 2025 |
Bibliographical note
Publisher Copyright:© 2025 Society for Industrial and Applied Mathematics, © by SIAM.
Keywords
- frequency domain
- full waveform inversion
- inverse scattering
- model order reduction
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