Interpretation of optical characterization of thin (10 nn) amorphous and microcrystalline silicon (doped) layers

A. Gordijn, J. Löffler, J.K. Rath, R.E.I. Schropp

Research output: Contribution to conference › Paper › Other research output

Original language	Undefined/Unknown
Publication status	Published - 19 Feb 2003
Event	2nd aSiNet Workshop - lisbon, Portugal Duration: 19 Feb 2003 → 21 Feb 2003

Cite this

@conference{932baf054ce9465a95c2d6353fa43d6f,

title = "Interpretation of optical characterization of thin (10 nn) amorphous and microcrystalline silicon (doped) layers",

author = "A. Gordijn and J. L{\"o}ffler and J.K. Rath and R.E.I. Schropp",

note = "2nd aSiNet Workshop; 2nd aSiNet Workshop ; Conference date: 19-02-2003 Through 21-02-2003",

year = "2003",

month = feb,

day = "19",

language = "Undefined/Unknown",

}