Integrated study of high resolution CT and XRF applied to natural building stones: preliminary results

Jan Dewanckele, Veerle Cnudde, Yoni De Witte, Matthieu Boone, Denis Van Loo, B Schouenborg, Luc Van Hoorebeke, Patric Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationBook of abstracts : 9th international conference on X\2010ray microscopy
Pages87-87
Number of pages1
Publication statusPublished - 2008

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