Abstract
The present status of in-situ scanning transmission X-ray microscopy (STXM) is reviewed, with an emphasis on the abilities of the STXM technique in comparison with electron microscopy. The experimental aspects and interpretation of X-ray absorption spectroscopy (XAS) are briefly introduced and the experimental boundary conditions that determine the potential applications for in-situ XAS and in-situ STXM studies are discussed. Nanoscale chemical imaging of catalysts under working conditions is outlined using cobalt and iron Fischer-Tropsch catalysts as showcases. In the discussion, we critically compare STXM-XAS and STEM-EELS (scanning transmission electron microscopy-electron energy loss spectroscopy) measurements and indicate some future directions of in-situ nanoscale imaging of catalytic solids and related nanomaterials.
| Original language | English |
|---|---|
| Pages (from-to) | 951-962 |
| Number of pages | 12 |
| Journal | ChemPhysChem |
| Volume | 11 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 6 Apr 2010 |
Funding
We acknowledge financial support for some of the work described in this review article from the Netherlands National Science Foundation (NWO/VICI program) as well as the Netherlands Research School Combination Catalysis (NRSC-C) and Shell Global Solutions.
Keywords
- electron microscopy
- Fischer-Tropsch catalysts
- in-situ scanning transmission X-ray microscopy (STXM)
- nanomaterials
- ADVANCED LIGHT-SOURCE
- OVER-EXCHANGED FE/ZSM5
- ELECTRON-MICROSCOPY
- ABSORPTION-SPECTROSCOPY
- ATOMIC-SCALE
- CHEMICAL CONTRAST
- RADIATION-DAMAGE
- BESSY-II
- SPECTROMICROSCOPY
- EDGE