Generation-recombination noise in a-Si:H studied by device simulations

J.P.R. Bakker, B.V. Fine, J.I. Dijkhuis

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)715
Number of pages1
JournalMaterials Research Society symposia proceedings
Publication statusPublished - 2002

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