Fano lines in the reflection spectrum of directly coupled systems of waveguides and cavities: Measurements, modeling, and manipulation of the Fano asymmetry

Jin Lian*, Sergei Sokolov, Emre Yüce, Sylvain Combrié, Alfredo De Rossi, Allard P. Mosk

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

We measured and analyzed reflection spectra of directly coupled systems of waveguides and cavities. The observed Fano lines offer insight on the reflection and coupling processes. Very different from side-coupled systems, the observed Fano line shape is not caused by the termini of the waveguide but by the coupling process between the measurement device fiber and the waveguide. Our experimental results and analytical model show that the Fano parameter that describes the Fano line shape is very sensitive to the coupling condition. A movement of the fiber well below the Rayleigh range can lead to a drastic change of the Fano line shape.

Original languageEnglish
Article number033812
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume96
Issue number3
DOIs
Publication statusPublished - 8 Sept 2017

Funding

The authors thank Sanli Faez, Pritam Pai, and Willem L. Vos for helpful discussions and Cornelis Harteveld for technical support. This paper is supported by the European Research Council Project No. 279248. A.P.M. acknowledges a Vici grant from the Nederlandse Organisatie voor Wetenschappelijk Onderzoek. APPENDIX:

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