Emotional and attributional style as risk or protective factors in the development of depression

T.J. Ferguson, L.M. van Dussen, Y. Van Beek, S.L. Crowley, T. Olthof

Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

Original languageUndefined/Unknown
Title of host publicationAbstracts XVth Biennial ISSBD Meeting
Place of PublicationBern
PublisherISSBD
Pages438-438
Number of pages1
Publication statusPublished - 1998

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