Emotional and attributional style as risk or protective factors in the development of depression

T.J. Ferguson, L.M. van Dussen, Y. Van Beek, S.L. Crowley, T. Olthof

Research output: Non-textual formDigital or Visual ProductsOther research output

Original languageEnglish
Place of PublicationBern
Publication statusPublished - 1998
EventXVth Biennial ISSBD Meeting - Bern
Duration: 1 Jan 1950 → …

Bibliographical note

XVth Biennial ISSBD Meeting

Keywords

  • Psychologie (PSYC)

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