Abstract
The full potential in catalyst development will only be
realized if characterization techniques are available that can
probe materials with subnanometer resolution. One of the
most employed techniques to image heterogeneous catalysts
at the nanometer and subnanometer scale is transmission
electron microscopy (TEM). As suggested by the name, TEM
uses electrons transmitted through the object for imaging.
Since the interaction between electrons and matter is very
strong, only thin parts, commonly much less than a micron
in thickness, are imaged. Since heterogeneous catalysts are,
in most cases, structured on a much smaller length scale,
the sample thickness can be reduced to TEM requirements
by appropriate preparation techniques and is, therefore, no
limitation.
Original language | Undefined/Unknown |
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Pages (from-to) | 1613-1629 |
Number of pages | 17 |
Journal | Chemical Reviews |
Volume | 109 |
Issue number | 5 |
Publication status | Published - 2009 |