Abstract
The direct manipulation of individual atoms in materials using scanning probe microscopy has been a seminal achievement of nanotechnology. Recent advances in imaging resolution and sample stability have made scanning transmission electron microscopy a promising alternative for single-atom manipulation of covalently bound materials. Pioneering experiments using an atomically focused electron beam have demonstrated the directed movement of silicon atoms over a handful of sites within the graphene lattice. Here, we achieve a much greater degree of control, allowing us to precisely move silicon impurities along an extended path, circulating a single hexagon, or back and forth between the two graphene sublattices. Even with manual operation, our manipulation rate is already comparable to the state-of-the-art in any atomically precise technique. We further explore the influence of electron energy on the manipulation rate, supported by improved theoretical modeling taking into account the vibrations of atoms near the impurities, and implement feedback to detect manipulation events in real time. In addition to atomic-level engineering of its structure and properties, graphene also provides an excellent platform for refining the accuracy of quantitative models and for the development of automated manipulation.
Original language | English |
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Pages (from-to) | 5319-5323 |
Number of pages | 5 |
Journal | Nano Letters |
Volume | 18 |
Issue number | 8 |
DOIs | |
Publication status | Published - 8 Aug 2018 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:Copyright © 2018 American Chemical Society.
Funding
T.S. and M.T. acknowledge the Austrian Science Fund (FWF) project P 28322-N36 for funding. T.S. was also supported by the European Research Council (ERC) Grant 756277-ATMEN and acknowledges the Vienna Scientific Cluster for computer time. A.M., C.M., and J.C.M. were supported by the ERC Grant 336453-PICOMAT. J.K. was supported by the FWF project I 3181-N36 and the Wiener Wissenschafts-, Forschungs-und Technologiefonds (WWTF) project MA14-009. N.A.P was supported by the Research Council of Norway through the Frinatek program and both N.A.P and M.J.V. are supported by the Belgian Fonds National de la Recherche Scientifique (FNRS) under Grant PDR T.1077.15-1/7 and acknowledge CECI (FNRS G.A. 2.5020.11) and CENAERO-zenobe (Walloon region G.A. 1117545) for computer time. T.S. and M.T. acknowledge the Austrian Science Fund (FWF) project P 28322-N36 for funding. T.S. was also supported by the European Research Council (ERC) Grant 756277-ATMEN and acknowledges the Vienna Scientific Cluster for computer time. A.M., C.M., and J.C.M. were supported by the ERC Grant 336453-PICOMAT. J.K. was supported by the FWF project I 3181-N36 and the Wiener Wissenschafts-, Forschungs-, und Technologiefonds (WWTF) project MA14-009. N.A.P was supported by the Research Council of Norway through the Frinatek program and both N.A.P and M.J.V. are supported by the Belgian Fonds National de la Recherche Scientifique (FNRS) under Grant PDR T.1077.15-1/7 and acknowledge CECI (FNRS G.A. 2.5020.11) and CENAERO-zenobe (Walloon region G.A. 1117545) for computer time.
Funders | Funder number |
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CECI | FNRS G.A. 2.5020.11 |
CENAERO-zenobe | 1117545 |
Forschungs-und Technologiefonds | |
Seventh Framework Programme | 336453, 756277 |
Institut national de la recherche scientifique | PDR T.1077.15-1/7 |
European Research Council | I 3181-N36 |
Vienna Science and Technology Fund | MA14-009 |
FWF Austrian Science Fund | P 28322-N36 |
Norges Forskningsråd |
Keywords
- 2D materials
- atom manipulation
- Electron microscopy
- nanotechnology