| Original language | Undefined/Unknown |
|---|---|
| Pages (from-to) | 2862 |
| Number of pages | 1 |
| Journal | Journal of Applied Physics |
| Volume | 82 |
| Publication status | Published - 1997 |
Effects of the defect structure on hydrogen transport in amorphous silicon
- S. Acco
- , W. Beyer
- , E.E.H. van Faassen
- , W. van der Weg
Research output: Contribution to journal › Article › Academic › peer-review